Nov. 22, 2017Products
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
Feb. 22, 2017Products
Park Systems has announced that its AFM operating software SmartScan is now available on Park XE series AFMs. The software completely automatizes all of the functions of setting up and taking the image once done manually by the ...
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