SMT
Nov. 03, 2009
In recent years there has been an ongoing trend to design specialized scanning electron microscopes, dedicated to specific applications. As a result two different system configurations in the SEM market have emerged: One configuration is dedicated to deliver high resolution imaging. The other configuration is dedicated to optimized analytical performance. However, these two diverging development lines force users to decide whether they will limit their research to high resolution imaging or optimized analytical investigations.
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