Jun. 13, 2017News
Using two novel techniques, researchers at the National Institute of Standards and Technology (NIST) have for the first time examined, with nanometer-scale precision, the variations in chemical composition and defects of widely used solar ...
Nov. 17, 2016Webcast
Next-generation solar cells made of super-thin films of semiconducting material hold promise because they’re relatively inexpensive and flexible enough to be applied just about anywhere.
Mar. 17, 2014Science
In this paper, we demonstrate the use of atomic force microscopy (AFM) with a conductive cantilever to study local electronic properties of silicon nanostructures: p-i-n radial junctions of amorphous Si grown on Si nanowires. We have ...
Sep. 27, 2012Science
In situ and analytical transmission electron microscopy (TEM) has been used to investigate the mechanism of material transport during Al-induced layer exchange (ALILE) and crystallization of amorphous Si (a-Si).
Apr. 17, 2012Applications
Scanning Electron Microscopy (SEM) has become a valuable tool for two- and three-dimensional characterization of micro- and nano-scale samples. A wide range of industry applications stand to benefit from this technology, e.g., materials ...
Nov. 09, 2011News
The Webinar: Advances and Performance Improvement Techniques in Large Substrate Inspection Microscopes will be presented by Leica Microsystems on imaging-git.com/lm on 01th Dec 2011, 5 p.m., 17:00 CET (free registration).
Jun. 29, 2011News
Electrical engineers have long been toying with the idea of designing biological molecules that can be directly integrated into electronic circuits. University of Pennsylvania researchers have developed a way to form these structures so ...
Jan. 04, 2010News
Federal research dollars will help South Dakota State University scientists build a first-of-its-kind microscope that could ultimately help scientists at SDSU and elsewhere develop better solar cells for converting sunlight to ...
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