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Spectroscopy

Spectra-Physics Introduces the New Spitfire Ace Power Amplifier
May. 15, 2012

Spectra-Physics Introduces the New Spitfire Ace Power Amplifier

Spectra-Physics, a Newport Corporation brand, has introduced the new Spitfire Ace Power Amplifier is a high power, ultrafast amplifier with advanced performance and guaranteed stability. more
PicoQuant Extends its Diode Laser Family
May. 05, 2012

PicoQuant Extends its Diode Laser Family

PicoQuant has added two laser heads emitting at   395 nm and 420 nm to its LDH Series.
Both laser heads are ideal for exciting e.g. porphyrin or phthalocyanin containing samples in fluorescence microscopy or fluorescence spectroscopy. With pulse durations as short as 70 ps, they are match the time resolution of mainstream detectors, yet at a price much lower than of mode-locked lasers or nanosecond flashlamps. The two laser heads are also available in a dual mode version that allows picosecond pulsed as well as continuous-wave operation. more
Tumor Detection With Photoacoustic Imaging
May. 04, 2012

Tumor Detection With Photoacoustic Imaging

AlphaScan from Spectra-Physics is a compact integrated optical-parametric oscillator and pump laser that outputs high energies in the near-infrared for photoacoustic imaging, also known as photoacoustic tomography.   more
Newport Introduces SCG-02 Wavelength Extender for Multimodal Spectroscopy and Imaging
Feb. 14, 2012

Newport Introduces SCG-02 Wavelength Extender for Multimodal Spectroscopy and Imaging

Newport Corporation has specifically designed its SCG-02 Wavelength Extender as a modular solution for supercontinuum generation when used with femtosecond Ti:Sapphire lasers, such as Newport Spectra-Physics' Tsunami, MaiTai DeepSee, and MaiTai ultrafast oscillators. Ideal for a variety of spectroscopy and microscopy applications, the laser input is split into two parallel beams: more
Triple-Frequency Atomic Force Microscopy
Jan. 16, 2012

Triple-Frequency Atomic Force Microscopy

It has previously been shown that bimodal tapping-mode AFM can provide increased compositional contrast. Here we discuss the addition of a third eigenmode to this scheme in order to acquire simultaneous topography, phase and frequency shift. The results suggest that, in general, the phase and frequency shift contrast exhibit anti-parallel behavior, although deviations from this trend are often observed in the experiments, such that all sources of contrast can provide complementary information. Multi-Frequency AFM more
Bruker Releases an Integrated System for Correlated Atomic Force Microscopy and Raman Spectroscopic Imaging
Dec. 06, 2011

Bruker Releases an Integrated System for Correlated Atomic Force Microscopy and Raman Spectroscopic ...

Bruker has released Innova-IRIS, an integrated system for correlated atomic force microscopy and Raman spectroscopic imaging. more
Andor Presents High Energy Camera Detection Systems
Nov. 07, 2011

Andor Presents High Energy Camera Detection Systems

The high energy camera detection portfolio from Andor Technology addresses a wide variety of imaging and spectroscopy applications from cell structure studies and medical research to material analysis. more
Frankfurt Laser Company Distributes Askion Line-Up of cw Laser Diode
Sep. 23, 2011

Frankfurt Laser Company Distributes Askion Line-Up of cw Laser Diode

Frankfurt Laser Company has added Askion cw Laser Diode Module HQML3 to its portfolio of laser diodes, laser diode modules and DPSS lasers.
Application Fields
• Bio-fluorescence
• Microscope Spectroscopy
• Biotechnology
• Medical Diagnostic
• Flow-cytometry
• General Research & Development more
Combination of Optical Microscopy and AFM-
Sep. 02, 2011

Combination of Optical Microscopy and AFM-

PicoQuant has combined its time-resolved confocal fluorescence microscope MicroTime200 with Brukers BioScope Catalyst Atomic Force Microscope (AFM). The synchronized acquisition of these two systems enables simultaneous recordings of AFM and optical images of the same sample region and makes new investigation schemes in the f more
X-Ray Spectroscopy Enables Elemental Mapping at the Atomic-Level
May. 04, 2011

X-Ray Spectroscopy Enables Elemental Mapping at the Atomic-Level

FEI Company has announced that elemental mapping at the atomic-level is now possible across the periodic table using ChemiSTEM Technology.
The combination of increased current in an atomic-sized probe by Cs-correction and the increase in X-ray detection sensitivity and beam current of the ChemiSTEM Technology allows results to be obtained within minutes. more
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