Jun. 21, 2017Products
Park Systems, world-leading manufacturer of Atomic Force Microscopes (AFM) just announced new Park NX12, an affordable versatile platform for analytical chemistry and electrochemistry researchers and multi-user facilities.
Mar. 21, 2017Science
Scanning tunneling microscopy produces high resolution images of surfaces and their adsorbates, ultimately reaching atomic resolution. Despite this impressive performance, the scope of this method is greatly limited by sample preparation. ...
Feb. 16, 2017Products
Oxford Instruments Asylum Research has launched its new European Atomic Force Microscopy (AFM) Probe Store.
May. 18, 2016Science
A multi-tip scanning tunneling microscope (STM) specifically designed for charge transport measurements at the nanoscale is described. This versatile tool gives insight into fundamental transport properties at the nanoscale. We exploit the ...
Jan. 26, 2015Science
The open source and community driven software project GXSM takes the next level to provide a highly and in-operando adaptable scanning probe microscopy (SPM) control system. A highly efficient digital signal processing (DSP) interfaces any ...
Dec. 08, 2014News
JPK Instruments, a manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announces the opening of their US offices in Southern California on 1st January, 2015. Heading up this new organization is Dr. ...
Apr. 24, 2013Products
Digital Surf has announced the official release of its Mountains 7 software for surface imaging and metrology.
Jun. 06, 2012News
The International Conference on Scanning Probe Microscopy on Soft and Polymeric Materials 2012, SPM on SPM 2012, will take place between September 23rd and 26th 2012 in Rolduc Abbey in Kerkrade (The Netherlands). With this topical ...
Jun. 01, 2012News
With a five-year warranty on all its Atomic Force/Scanning Probe Microscopes, Asylum Research sets a higher standard in customer support.
Nov. 03, 2011Products
Asylum Research has launched the Variable Field Module2 (VFM2) for magnetic atomic force microscopy applications with MFP-3D Atomic Force Microscopes (AFM).
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