May. 15, 2012
Dr. Boris Zarda from Leica Microsystems shows the differences of confocal microscopy and STED microscopy on the basis of different examples.
moreDec. 27, 2011
Stimulated emission depletion microscopy has been used to overcome the diffraction limit of confocal fluorescence microscopy. By exploiting information present in the arrival time of fluorescence photons through time-gating, the resolution of STED microscopes can be improved significantly. The resolution improvement of this technique - termed "T-STED" - becomes most evident in CW-STED where the STED beam is of long duration compared to the lifetime of the fluorophore.