Aug. 03, 2016Products
Tescan is a multi-national company and a leading global developer and supplier of scanning electron microscopes (SEMs), focused ion beam scanning electron microscope (FIB-SEM) systems, unique solutions for SEM and FIB-SEM ...
Jul. 22, 2016Products
Tescan has introduced Triglav a ultra-high resolution (UHR) electron column technology with significant improvement in quality imaging and analytical capabilities.
Nov. 06, 2015Products
Micro to Nano has introduced a comprehensive range of EM-Tec SEM sample holders. The EM-Tec SEM sample holders increase SEM productivity, avoid contamination issues and use no adhesives.
Apr. 27, 2015Products
Tescan has introduced its multimodal holographic microscope Q-PHASE. The optical microscope is based on the principle of non-coherent holography and uses white light for illumination, thus producing high quality imaging.
Feb. 19, 2015News
WITec and Tescan have been recognized with a 2015 Photonics Prism Award. An expert jury named the correlative RISE microscope as winner in the metrology category. The Prism Award is given for top innovations in the field of photonics, ...
Jan. 12, 2015News
The Analytical Scientist Innovation Awards (TASIAs) recognize top innovations in the field of analytical chemistry. A jury of three independent experts and The Analytical Scientist editorial team chose the Raman Imaging and Scanning ...
Dec. 01, 2014News
RISE Microscopy has been nominated for a 2015 Photonics Prism Award. These well-respected product innovation awards honor the best new photonic products on the market and are each year presented by SPIE and Photonics Media at a gala event ...
Mar. 28, 2014Products
WITec and Tescan have introduced RISE Microscopy, a correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system.
Jul. 22, 2013Products
Tescan will introduce MAIA FESEM at the M&M 2013 trade show in Indianapolis.
Jul. 24, 2012Products
Tescan will introduce the its fully integrated Plasma source FIB-FESEM workstation at the 2012 Microscopy and Microanalysis Trade Show in Phoenix, Arizona.
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