Oct. 05, 2013
The combination of ACOM-TEM with in situ straining inside a TEM enables direct imaging of the local crystal orientation at the nanoscale during straining of nanocrystalline metals and thus various deformation processes such as grain growth, twinning/detwinning and grain rotation can be distinguished in real space. A quantitative analysis of the crystal orientation changes observed by this new approach was used to study the deformation processes in nanocrystalline gold .
moreOct. 11, 2012
The theoretical and experimental framework of a new coherent diffraction strain imaging approach was developed in the Center for Nanoscale Materials' X-Ray Microscopy Group in collaboration with Argonne's Materials Science Division, together with users from IBM.
moreSep. 27, 2012
In situ and analytical transmission electron microscopy (TEM) has been used to investigate the mechanism of material transport during Al-induced layer exchange (ALILE) and crystallization of amorphous Si (a-Si).
moreApr. 17, 2012
Scanning Electron Microscopy (SEM) has become a valuable tool for two- and three-dimensional characterization of micro- and nano-scale samples. A wide range of industry applications stand to benefit from this technology, e.g., materials research, development of pharmaceutical products, and process development in semiconductor or photovoltaic manufacturing. What they have in common: a specific region of a specimen has to be analyzed.
moreApr. 16, 2012
Electron microscopy, conducted as part of the Shared Research Equipment (ShaRE) User Program at the Department of Energy's Oak Ridge National Laboratory, has led to a new theory to explain intriguing properties in a material with potential applications in capacitors and actuators.
moreDec. 08, 2011
The Laboratory of Polymer Chemistry at the Université Libre de Bruxelles is focused on research into "small molecules", namely, liquid crystalline semiconductors for organic electronics application. Various organic semiconductors have been receiving a great deal of attention in "plastic" electronic devices such as organic photovoltaic cells, light-emitting diodes (OLED) and field effect transistors (OFET).
moreApr. 01, 2007
International Conferences for Vacuum, Surface Science & Nanoscience and Technology 2007: All in One - The 17th International Vacuum Conference (IVC17), 13th International Conference on Surface Science (ICSS) and International Conference on Nanoscience and Technology (ICN+T) will be held together with three smaller nordic conferences (NCSS-6, NSM-22 and SVM-4) in Stockholm this year from 2 July to 6 July.
moreJan. 01, 2007
International Vacuum Congress & International Conference on Surface & International Conference on Nanoscience and Technology - All in One: This year, the 17th International Vacuum Congress (IVC-17), the 13th International Conference on Surface Science (ICSS-13) and the International Conference on Nanoscience and Technology (ICN+T 2007) will be combined to a super congress. It is also co-organized with three smaller meetings of related Nordic Societies (NCSS-6, NSM-22 and SVM-4).