You are here: Home

Topographic Scans

Asylum Research Introduces AFM Technique that Enables Nanoscale Mapping of Permittivity and Conductivity on Any Material
Jan. 20, 2014

Asylum Research Introduces AFM Technique that Enables Nanoscale Mapping of Permittivity and ...

Asylum Research has introduced Scanning Microwave Impedance Microscopy (sMIM), an atomic force microscopy (AFM) technique that provides valuable nanomechanical and nanoelectrical information in addition to high resolution AFM topography of permittivity and conductivity on any material including conductors, semiconductors and insulators. sMIM is available integrated exclusively with Asylum Research MFP-3D and Cypher AFMs. more
Simpler, More Stable, More Quantitative AFM Imaging with Asylum’s blueDrive
Nov. 11, 2013

Simpler, More Stable, More Quantitative AFM Imaging with Asylum’s blueDrive

New blueDrive Photothermal Excitation for Asylum Research Cypher AFMs uses a modulated blue laser to directly drive the cantilever during AC mode imaging, producing an ideal frequency and phase response. AC modes typically rely on piezoacoustic drive, which in liquid produces an obviously distorted and time-varying response. In air, the high Q of the lever can mask the problem, but it still interferes with quantitative analysis.
more
Hitachi TM3030: Tabletop Scanning Electron Microscope with Improved Electron-optical System
Jun. 04, 2013

Hitachi TM3030: Tabletop Scanning Electron Microscope with Improved Electron-optical System

Hitachi High-Technologies has announced the availability of the TM3030, the third generation of its series of tabletop scanning electron microscopes.
The TM3030 provides higher-resolution images and higher magnification capabilities through optimization of the electron optics system. The better resolution is especially useful for the 5kV mode of operation. Imaging at 5 kV reveals more surface detail and can be used for both topographic and elemental composition imaging. more
Integrating an Optical Profilometer in a Raman Microscope
Oct. 18, 2012

Integrating an Optical Profilometer in a Raman Microscope

Witec has announced the availability of its TrueSurface microscopy as an integrated option for the alpha300 microscope series.

This development enables topographic Raman Imaging on large samples for the full range of Witec instruments. The imaging mode is also available as an upgrade for installed alpha300 and alpha500 systems. more
True Surface Microscopy for Topographic Confocal Raman Imaging
Feb. 07, 2012

True Surface Microscopy for Topographic Confocal Raman Imaging

Confocal Raman imaging opened the door for many applications in Raman spectroscopy and imaging that were previously unavailable for measurement with conventional (non-confocal) Raman methods. However, high confocality always results in high focus sensitivity and this can make measurements difficult with rough and/or inclined samples. Especially when performing scans on a larger scale (scan size larger than 1 mm), this often necessitated careful alignment and extensive sample preparation. more
RSS Newsletter