Sep. 29, 2011

Multimodal Optical Nanoprobe for Transmission Electron Microscopes

The U.S. Department of Energy's Brookhaven National Laboratory and Nanofactory Instruments, a Swedish company that develops and markets scanning probe microscopy instrumentation, have received the 2011 Microscopy Today Innovation Award. Microscopy Today is an academic journal owned by the Microscopy Society of America, an affiliate of the American Institute of Physics and the American Association for the Advancement of Science, and published by Cambridge University Press.
moreAug. 11, 2011

Communication Problems in Nerve Cells

Is the cause of diseases such as Alzheimer‘s, epilepsy and schizophrenia rooted in a deficiency or rise in chemical messengers? The „Functional Cell Biology" working group at the Charité University Hospital‘s Institute for Integrative Neuroanatomy in Berlin is looking into this and similar issues. The results are forming the basis of a fundamental understanding of the diseases and are intended to provide indications for therapeutic approaches. Researchers are employing the latest imaging and image analysis techniques and methods in the course of their investigations.
moreMar. 15, 2010

Graphene Synthesis & Applications

Electron Microscopy Sciences (EMS) announced the addition of graphene transmission electron microscope support films to its product line. Graphene is a single atomic layer of carbon atoms tightly packed in a two-dimensional honeycomb lattice. The novel material has generated great interest throughout the scientific and technological community because of its remarkable properties and numerous potential applications. However, obtaining pure and highly ordered graphene has been a challenge. moreFeb. 24, 2010

Atomic Resolution Data in Record Time

The Jeol JEM-ARM200F TEM is the first transmission electron microscope to be installed at the University of Texas at San Antonio, USA, in January, and by early February began producing imaging results. The microscpope represents more than 60 years of TEM expertise and was designed from the ground up to integrate aberration correction into a super-shielded electron column that safeguards the ultrahigh-powered optics from environmental interferences. moreNov. 01, 2007

Centra 100, Carl Zeiss SMT: Transmission Electron Microscope

Centra 100, Carl Zeiss SMT: Transmission Electron Microscope. The Nano Technology Systems Division (NTS) at Carl Zeiss SMT will introduce the new Centra 100, a transmission electron microscope with up to 100 kV accelerating voltage, at the MC Saarbrücken. Specially designed as a sophisticated "imaging system", the highly compact and robust instrument offers maximum resolution down to 0.2 nm. The ease-of-use and fast specimen exchange capability make this microscope particularly well-suited for biomedical or clinical laboratory environments. moreJul. 01, 2007

Analytical TEM: Electron Microscopy Facility at Caesar

Analytical TEM: Electron Microscopy Facility at Caesar - Bonn-Plittersdorf nearby the former government district is the destination of the center of advanced European studies and research - caesar. The international research center was established in 1999 as largest single measure within the Bonn-Berlin Act. caesar conducts research in interdisciplinary teams in the areas of biotechnology and materials sciences. moreJul. 01, 2007

Carl Zeiss SMT: Transmission Electron Microscope for Caesar Research Center

Carl Zeiss SMT: Transmission Electron Microscope for Caesar Research Center - During an official inauguration ceremony in June, Carl Zeiss SMT handed over a unique transmission electron microscope (TEM) to the caesar Research Center (center of advanced European studies and research) in Bonn. The so-called CRISP (Corrected Illumination Scanning Probe) system was developed and produced by the Nano Technology Systems (NTS) division of Carl Zeiss SMT AG in Germany. CRISP provides unparalleled insights into the innermost properties of materials, right down to the atomic level. moreNov. 01, 2005

FEI: Titan 80- 300

FEI: Titan 80- 300. FEI announced that it has begun shipping its new scanning/ transmission electron microscope (S/TEM), the Titan 80- 300, as it publicly unveiled the new system at the Microscopy and Microanalysis 2005 Conference in Honolulu. With an all-new platform dedicated to correction and monochromator technology, the system is the world's highest resolution commercially-available microscope, yielding powerful sub- Angstrom (atomic scale) imaging and analysis. moreNov. 01, 2005

FEI: new software and hardware for Tecnai G2 transmission electron microscope

FEI: new software and hardware for Tecnai G2 transmission electron microscope. FEI released new software and hardware for its Tecnai G2 transmission electron microscope (TEM) at Microscopy and Microanalysis 2005 Conference in Honolulu. more