May. 06, 2013
Ted Pella, Inc has announced the availability of the new research-ready Pelco graphene TEM support films.
The films are supported by lacey carbon film on a 300 mesh copper grid. The single, continuous graphene sheet covers the entire 300 mesh area of the TEM grid. This creates a usable area of around 75% of the TEM grid, leaving plenty of space for specimens or experiments. The Pelco graphene TEM support films with the large area continuous film can be used directly out of the box.
moreApr. 29, 2013
The macroscopic effects of certain nanoparticles on human health have long been clear to the naked eye. What scientists have lacked is the ability to see the detailed movements of individual particles that give rise to those effects. In a recently published study, scientists at the Virginia Tech Carilion Research Institute invented a technique for imaging nanoparticle dynamics with atomic resolution as these dynamics occur in a liquid environment. The results will allow, for the first time, the imaging of nanoscale processes, such as the engulfment of nanoparticles into cells.
moreMar. 14, 2013
Single Electron Events (SEE) have been used to quantify the point spread function of several cameras for Transmission Electron Microscopy (TEM). The spatial resolution is measured by the Single Electron Modulation Transfer Function (MTFSEE) compared with the MTF generated by standard knife edge experiment. In addition, the sensitivity of the camera as a function of high tension has been measured, showing an excellent Signal-to-Noise Ratio (SNR) from 300 kV down to 8 kV.
moreDec. 12, 2012
The group of Dr Rikke Meyer from the interdisciplinary Nanoscience Center (iNANO) at Aarhus University, Denmark has used AFM and single-cell force spectroscopy to work at the interface between microbiology and nanoscience in the quest to understand how bacteria form biofilms and how this may be prevented.
moreOct. 18, 2012
The EasyLift nanomanipulator from FEI allows improved ease of use, reliability, precision and integration in preparing ultra-thin samples for analysis in a transmission electron microscope (TEM).
It is designed specifically for in-situ liftout TEM sample preparation and other demanding nanomanipulation activities. EasyLift is now available on the Helios NanoLab and Versa 3D DualBeam systems.
moreSep. 27, 2012
In situ and analytical transmission electron microscopy (TEM) has been used to investigate the mechanism of material transport during Al-induced layer exchange (ALILE) and crystallization of amorphous Si (a-Si).
moreSep. 20, 2012
SiMPore (Rochester, USA) and KonTEM (Bonn, Germany) announce their collaboration to develop phase contrast solutions for transmission electron microscopy (TEM). Anelectron microscope uses a beam of electrons instead of light to illuminate an object of interest.
moreAug. 23, 2012
Opto-digital technology is the core competence of Olympus, creating innovative imaging solutions for all application areas and via its subsidiary Olympus Soft Imaging Solutions - electron microscopy solutions since 1987. Knowing what gets the client a step further and being foresight, flexible and modular when seeking for sophisticated solutions and exciting cooperation's leads towards real consultancy and fascinated solutions.
moreJul. 25, 2012
FEI Company has introduced an environmental transmission electron microscope (ETEM) that enables time-resolved, in-situ studies of processes and materials exposed to reactive gases and elevated temperatures.
Titan ETEM G2 can be used to study the relationships between structure and performance by observing atomic scale processes and gas-solid interactions under conditions that mimic the operational environment. The system is designed for in situ chemical reactions and catalysis experiments.
moreMar. 07, 2012
Researchers at the University of Sheffield have revolutionised the electron microscope by developing a new method which could create the highest resolution images ever seen.
For over 70 years, transmission electron microscopy (TEM), which `looks through´ an object to see atomic features within it, has been constrained by the relatively poor lenses which are used to form the image.