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Veeco

Oct. 08, 2010

Bruker Completes Acquisition of Veeco

Bruker Corporation acquisition of Veeco Instruments' Metrology & Instrumentation Group, which includes the AFM, Optical Profiler and Stylus Profiler product lines, is now complete. more
Aug. 17, 2010

Bruker to Acquire Veeco's Scanning Probe Microscopy (SPM) and Optical Industrial Metrology (OIM) ...

Bruker Corporation announces the signing of an agreement to acquire the Scanning Probe Microscopy (SPM) and Optical Industrial Metrology (OIM) instruments business from Veeco Instruments for US-$ 229 million in cash. The transaction has been approved by the Boards of Directors of both companies and is expected to close during the fourth quarter of 2010, pending regulatory review and subject to customary closing conditions. more
Sharp Nitride Lever - Probes
Apr. 30, 2010

Sharp Nitride Lever - Probes

Veeco is committed to delivering high quality, applications-enabling cantilever technology in the market. The Probes Nanofabrication Facility produces fine probes for not only current applications, but also for the emerging research of tomorrow. For example the standard configuration probes (SNL) or the Microlever version (MSNL) in the SNL probes series. Veeco has released the latest in super-sharp nitride probes for contact or fluid tapping applications. The new Sharp Nitride Lever (SNL) Probe Series can unlock the true high-resolution in samples, without higher expenses. more
Veeco Appoints New Chief Financial Officer
Jan. 13, 2010

Veeco Appoints New Chief Financial Officer

Veeco Instruments announced that David D. Glass will be joining the Company effective January 18, 2010 as Executive Vice President, Finance and Chief Financial Officer (CFO). Glass will replace John F. Rein, Jr. who announced his retirement from Veeco last year. Glass joins Veeco following a twenty-five year career with Rohm and Haas Company, a global specialty materials company that was acquired in 2009 by The Dow Chemical Company. more
Three-Dimensional Surface Characterization
Nov. 02, 2009

Three-Dimensional Surface Characterization

Veeco Instruments announced the release of its NPFLEX 3D Metrology System for characterizing surfaces previously too difficult to measure due to size or part orientation. The System combines the industry-leading performance of the non-contact, white light optical profilers with a unique open-access design to enable rapid, three-dimensional data acquisition and analysis on a wide range of large samples for precision machining applications in the medical implant, aerospace, and automotive market sectors. more
Dec. 01, 2008

Asylum Research & Veeco: Patent Dispute Settled

Asylum Research & Veeco: Patent Dispute Settled. Asylum Research Corporation announced that the patent litigation between it and Veeco Instruments which started in September 2003 has been settled. Under the terms of the settlement, Asylum and Veeco have agreed to drop all pending claims against each other and agreed to a five-year, worldwide cross license of each other's patents and a mutual covenant not to sue on patents either party has a right to assert. Asylum will pay an initial license fee to Veeco plus an ongoing royalty for the five-year term of the cross license. more
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