Apr. 09, 2013

WITec PaperAward 2013

WITec appoints the winners of the PaperAward 2013: Research groups from France, Germany, and Spain are among the winners. For WITec PaperAward 2013, 54 publications, published between January and December 2012, were submitted to this year's competition. Due to the number of high-quality papers, the PaperAward jury decided to recognize three winning papers in gold, silver, and bronze.
moreMar. 25, 2013

StrobeLock: A Time-Correlated Single Photon Counting Measurement Option

WITec has launched StrobeLock, a time-correlated single photon counting measurement option. The imaging modes include Fluorescence Lifetime Imaging and Time-resolved Luminescence Microscopy, which can be integrated with the alpha300 and alpha500 microscope series.
moreFeb. 04, 2013

3D Confocal Raman Imaging

Structured substrates are widely employed in semiconductor research and especially in current semiconductor development. The high demands on device quality and reliability make it increasingly important to have a detailed knowledge of the inherent strain and crystalline properties of device structures. X-ray diffraction is commonly used in order to probe film thicknesses, lattice constants and strain states of layer structures and scanning electron microscopy (SEM) is used to inspect surfaces and defects in the structure to understand the growth history.
moreJan. 21, 2013

3D Raman Imaging meets AFM, SNOM and Profilometry - Workshop Series Germany

A workshop-series on combining 3D Raman imaging with AFM, SNOM and Profilometry will take place in five German cities from 19 February to 5 March. Each workshop of the series will introduce the principles of state-of-the-art Confocal Raman Imaging as a tool for analyzing the chemical characteristics of a sample three-dimensionally, inside and at the surface of the sample.
moreNov. 29, 2012

WITec Extends Distribution in Israel

WITec and Advanced Technological Solutions Ltd. (ATSL) have announced that they have entered into a new distribution agreement that will enable WITec to extend its global reach and promote its full product line of high-resolution SNOM, AFM and Raman Imaging solutions in Israel.
moreNov. 26, 2012

WITec Expands Presence in Canada

WITec selected Spectra Research Corporation (SRC) as new sales representative in Canada. Due to the well-established and very active scientific communities in the country the expansion is a logical step in order to strengthen WITec's regional presence.
moreOct. 18, 2012

Integrating an Optical Profilometer in a Raman Microscope

Witec has announced the availability of its TrueSurface microscopy as an integrated option for the alpha300 microscope series.

This development enables topographic Raman Imaging on large samples for the full range of Witec instruments. The imaging mode is also available as an upgrade for installed alpha300 and alpha500 systems. moreOct. 11, 2012

9th Confocal Raman Imaging Symposium

The worldwide Raman Imaging Community met from 26. - 27. September at the 9th Confocal Raman Imaging Symposium in Ulm, Germany to discuss the latest developments in the field. Featured at this year's event were the application possibilities of high-resolution Raman microscopy in pharmaceutical research as well as materials, geo-, and life sciences.
moreApr. 11, 2012

WITec Paper Award 2011

The winner of the WITec Paper Award 2011 has been announced. This year the award goes to Diedrich A. Schmidt, North Carolina A&T State University, USA, Taisuke Ohta and Thomas E. Beechem both from the Sandia National Laboratories, Albuquerque, New Mexico, USA for their paper: "Strain and charge carrier coupling in epitaxial graphene", Phys. Rev. B 84, 235422 (2011).
moreFeb. 07, 2012

True Surface Microscopy for Topographic Confocal Raman Imaging

Confocal Raman imaging opened the door for many applications in Raman spectroscopy and imaging that were previously unavailable for measurement with conventional (non-confocal) Raman methods. However, high confocality always results in high focus sensitivity and this can make measurements difficult with rough and/or inclined samples. Especially when performing scans on a larger scale (scan size larger than 1 mm), this often necessitated careful alignment and extensive sample preparation. more