Mar. 28, 2014
WITec and Tescan have introduced RISE Microscopy, a correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system.
moreMar. 27, 2014
RISE Microscopy is a novel correlative microscopy technique that combines Scanning Electron Microscopy (SEM) and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
moreDec. 02, 2013
Comprehensive investigations of geological samples can be challenging due to variations in size, shape, structure and composition. For that reason flexible analysis techniques are required which can be easily adapted to individual sample characteristics.
moreNov. 14, 2013
Why is raman atomic force microscopy needed in scientific application? Which are the advantages and important applications at the moment? Imaging & Microcopy on Tour 2013 presents a brief interview with Thomas Dieing, Director Applications & Support from WITec.
moreOct. 17, 2013
This year WITec, manufacturer of Raman microscopy technology, celebrated the 10th anniversary of their confocal Raman imaging symposium in Ulm, the German city where the company's headquarters is also located. Hosted at the Stadthaus in the city centre next to its famous cathedral, the three-day-conference - September 30 to October 2 - was attended by over 110 international participants. Besides 16 lectures and 21 poster contributions, a broad range of Raman imaging applications and technology aspects were presented to the audience. The last day of the Symposium was reserved for equipment demonstrations given at the company's headquarters.
moreJun. 13, 2013
WITec will host the 10th Symposium on "Confocal Raman Imaging". The Raman Spectroscopy community will meet from September 30th to October 2nd, 2013 in Ulm, Germany. The symposium will cover various aspects of modern Raman microscopy and will provide deep insights into confocal Raman imaging and its applications.
moreApr. 09, 2013
WITec appoints the winners of the PaperAward 2013: Research groups from France, Germany, and Spain are among the winners. For WITec PaperAward 2013, 54 publications, published between January and December 2012, were submitted to this year's competition. Due to the number of high-quality papers, the PaperAward jury decided to recognize three winning papers in gold, silver, and bronze.
moreMar. 25, 2013
WITec has launched StrobeLock, a time-correlated single photon counting measurement option. The imaging modes include Fluorescence Lifetime Imaging and Time-resolved Luminescence Microscopy, which can be integrated with the alpha300 and alpha500 microscope series.
moreFeb. 04, 2013
Structured substrates are widely employed in semiconductor research and especially in current semiconductor development. The high demands on device quality and reliability make it increasingly important to have a detailed knowledge of the inherent strain and crystalline properties of device structures. X-ray diffraction is commonly used in order to probe film thicknesses, lattice constants and strain states of layer structures and scanning electron microscopy (SEM) is used to inspect surfaces and defects in the structure to understand the growth history.
moreJan. 21, 2013
A workshop-series on combining 3D Raman imaging with AFM, SNOM and Profilometry will take place in five German cities from 19 February to 5 March. Each workshop of the series will introduce the principles of state-of-the-art Confocal Raman Imaging as a tool for analyzing the chemical characteristics of a sample three-dimensionally, inside and at the surface of the sample.