You are here: Home

WITec

WITec and Tescan Introduce RISE Microscopy
Mar. 28, 2014

WITec and Tescan Introduce RISE Microscopy

WITec and Tescan have introduced RISE Microscopy, a correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system. more
RISE Microscopy
Mar. 27, 2014

RISE Microscopy

RISE Microscopy is a novel correlative microscopy technique that combines Scanning Electron Microscopy (SEM) and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
more
Characterization of Geological Samples
Dec. 02, 2013

Characterization of Geological Samples

Comprehensive investigations of geological samples can be challenging due to variations in size, shape, structure and composition. For that reason flexible analysis techniques are required which can be easily adapted to individual sample characteristics. more
Nov. 14, 2013

Raman Atomic Force Microscopy

Why is raman atomic force microscopy needed in scientific application? Which are the advantages and important applications at the moment? Imaging & Microcopy on Tour 2013 presents a brief interview with Thomas Dieing, Director Applications & Support from WITec. more
Symposium on Confocal Raman Imaging
Oct. 17, 2013

Symposium on Confocal Raman Imaging

This year WITec, manufacturer of Raman microscopy technology, celebrated the 10th anniversary of their confocal Raman imaging symposium in Ulm, the German city where the company's headquarters is also located. Hosted at the Stadthaus in the city centre next to its famous cathedral, the three-day-conference - September 30 to October 2 - was attended by over 110 international participants. Besides 16 lectures and 21 poster contributions, a broad range of Raman imaging applications and technology aspects were presented to the audience. The last day of the Symposium was reserved for equipment demonstrations given at the company's headquarters.
more
Jun. 13, 2013

10th Confocal Raman Imaging Symposium

WITec will host the 10th Symposium on "Confocal Raman Imaging". The Raman Spectroscopy community will meet from September 30th to October 2nd, 2013 in Ulm, Germany. The symposium will cover various aspects of modern Raman microscopy and will provide deep insights into confocal Raman imaging and its applications.
more
WITec PaperAward 2013
Apr. 09, 2013

WITec PaperAward 2013

WITec appoints the winners of the PaperAward 2013: Research groups from France, Germany, and Spain are among the winners. For WITec PaperAward 2013, 54 publications, published between January and December 2012, were submitted to this year's competition. Due to the number of high-quality papers, the PaperAward jury decided to recognize three winning papers in gold, silver, and bronze.
more
StrobeLock: A Time-Correlated Single Photon Counting Measurement Option
Mar. 25, 2013

StrobeLock: A Time-Correlated Single Photon Counting Measurement Option

WITec has launched StrobeLock, a time-correlated single photon counting measurement option. The imaging modes include Fluorescence Lifetime Imaging and Time-resolved Luminescence Microscopy, which can be integrated with the alpha300 and alpha500 microscope series.
more
3D Confocal Raman Imaging
Feb. 04, 2013

3D Confocal Raman Imaging

Structured substrates are widely employed in semiconductor research and especially in current semiconductor development. The high demands on device quality and reliability make it increasingly important to have a detailed knowledge of the inherent strain and crystalline properties of device structures. X-ray diffraction is commonly used in order to probe film thicknesses, lattice constants and strain states of layer structures and scanning electron microscopy (SEM) is used to inspect surfaces and defects in the structure to understand the growth history.
more
3D Raman Imaging meets AFM, SNOM and Profilometry - Workshop Series Germany
Jan. 21, 2013

3D Raman Imaging meets AFM, SNOM and Profilometry - Workshop Series Germany

A workshop-series on combining 3D Raman imaging with AFM, SNOM and Profilometry will take place in five German cities from 19 February to 5 March. Each workshop of the series will introduce the principles of state-of-the-art Confocal Raman Imaging as a tool for analyzing the chemical characteristics of a sample three-dimensionally, inside and at the surface of the sample.
more
RSS Newsletter