Apr. 11, 2012
The winner of the WITec Paper Award 2011 has been announced. This year the award goes to Diedrich A. Schmidt, North Carolina A&T State University, USA, Taisuke Ohta and Thomas E. Beechem both from the Sandia National Laboratories, Albuquerque, New Mexico, USA for their paper: "Strain and charge carrier coupling in epitaxial graphene", Phys. Rev. B 84, 235422 (2011).
moreFeb. 07, 2012
Confocal Raman imaging opened the door for many applications in Raman spectroscopy and imaging that were previously unavailable for measurement with conventional (non-confocal) Raman methods. However, high confocality always results in high focus sensitivity and this can make measurements difficult with rough and/or inclined samples. Especially when performing scans on a larger scale (scan size larger than 1 mm), this often necessitated careful alignment and extensive sample preparation.
moreFeb. 02, 2012
WITec has received the prestigious Photonics Prism Award 2011 for the development of TrueSurface Microscopy. This internationally respected product innovation award recognizes cutting-edge products that break conventional ideas and improve life through photonics and is presented each year by SPIE and Photonics Media.
moreOct. 18, 2011
With a record-breaking 95 delegates, the 8th Confocal Raman Imaging Symposium took place in Ulm, Germany from October 5th - 6th. Over the years the symposium has evolved to become one of the leading venues worldwide for the discussion of the latest developments in high-resolution Raman Imaging. Featuring a global line-up of Raman Imaging experts, the symposium gave scientist the opportunity to see the newest applications and relevant instrument configurations.
moreAug. 23, 2011
The 8th symposium on "Confocal Raman Imaging" will be held in Ulm, Germany from October 05 - 06, 2011. It will cover various aspects of modern Raman microscopy and will provide an introduction to Raman spectroscopy in general as well as operational principles and instrumentation relevant to the techniques.
Participants are encouraged to submit an abstract for the poster session by September 2nd 2011.
For more details, program and registration information please see:
moreJun. 21, 2011
With the most recent introduction of a new multi-wavelength excitation-laser coupling unit WITec has further advanced the ease-of-use of its microscope series. It is now possible to switch between up to three laser sources by the simple rotation of a filter wheel. Calibration and alignment of the laser beam path is guaranteed at all positions assuring accurate and variable Raman Imaging. Each excitation wavelength features a high-quality and wavelength optimized filter set, enabling the highest throughput and contributes to the speed and sensitivity of WITec's systems.
moreMar. 22, 2011
The Editors Choice Awards honors the most significant and important technological advancement introduced at the Pittcon conference and technical exhibition (14.-17.March 2011, Atlanta, USA). This year 27 different products were nominated by a panel of more than 150 editors.
moreFeb. 23, 2011
WITec announced the winner of the WITec Paper Award 2010. The award goes to Konrad Meister, Diedrich Schmidt, Erik Bründermann and Martina Havenith from Ruhr-University Bochum as authors of the paper: "Confocal Raman microspectroscopy as an analytical tool to assess the mitochondrial status in human spermatozoa" (Analyst, 2010, 135, 1370 - 1374). The paper was submitted by Dr. Diedrich Schmidt who will additionally receive a 500 Euro Amazon Gift card.
moreDec. 15, 2010
A better understanding of the micro- and nanostructures of cellulose fiber composition before and after various chemical treatments together with the distribution of bleaching additives to the final paper composition is essential for further improvements of paper properties. Confocal Raman imaging is a valuable tool for such studies, as it not only reveals optical information but also information regarding the 3D distribution of the chemical compounds in the sub-micrometer range [1-3].
moreDec. 09, 2010
Surface Topography With High Precision: WITec has launched the True Surface Microscopy option. The core element of this imaging mode is an integrated sensor for optical profilometry. Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data.
more