22.01.2010

Spectrometer for Material Analysis

Spectro xSORT is a compact, ergonomically designed, handheld ED-XRF spectrometer for high throughput elemental testing, screening and analysis of a broad range of materials in widely varying locations, environments and conditions. It employs innovative and efficient components proven for the demanding tasks of handheld sample excitation and signal detection. Top quality manufacturing and an attention to details are the basis for the unique precision, speed and safety of this system that delivers laboratory-like results onsite. more17.12.2009

Correlative Microscopy

Correlative Microscopy offers huge opportunities in the analysis of samples.
Shuttle & Find is the first commercially available interface for Correlative Microscopy in Material Analysis.
Learn more about this solution: www.smt.zeiss.com more17.11.2009

Highly Flexible CrossBeam Workstation

To study the chemical analysis, crystallographic information, the complete morphology, electrical information of various FIB-SEM samples, the Auriga Workstation from Carl Zeiss NTS features redesigned vacuum chamber, which includes a total of 15 ports for different detectors. Additionally, a charge compensation system enables the local application of an inert gas flush. In this way, electrostatic charging of non-conductive samples is neutralized and detection of secondary electrons (SE) as well as backscattered electrons (BSE) becomes feasible. more01.10.2009

To Image the “Anatomy” of a Molecule

IBM scientists have been able to image the "anatomy"-or chemical structure-inside a molecule with unprecedented resolution, using a complex technique known as noncontact atomic force microscopy (AFM).
The results push the exploration of using molecules and atoms at the smallest scale and could greatly impact the field of nanotechnology, which seeks to understand and control some of the smallest objects know to mankind. more