Advantages of Vacuum for Electrical Scanning Probe Microscopy
Park NX-Hivac AFM
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Park Systems NX-Hivac allows failure analysis engineers and researchers to improve the sensitivity and resolution of their measurements through high vacuum scanning spreading resistance microscopy (SSRM). Because high vacuum scanning offers greater accuracy and better repeatability than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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