Dec. 23, 2019

Atomic Force Microscopy: Choosing an AFM

  • Tosca Series Tosca Series

Atomic force microscopy (AFM) is based on a simple measuring principle. In order to measure reliably on a nanometer scale, however, a sophisticated instrument design is required.

In practice, this usually also implies a complex user interface. Users are often expected to deal with complicated settings; they should have prior knowledge of AFM technology and need a substantial amount of time for their measurements. But does a sophisticated instrument necessarily have to imply complex usability? Find out which aspects you should consider when choosing an AFM!

Download the whitepaper here!


Anton Paar GmbH
Anton-Paar-Str. 20
8054 Graz
Phone: +43 (0)316/257-0
Telefax: +43 (0)316/257-257

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