Atomic Force Microscopy: Choosing an AFM
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Atomic force microscopy (AFM) is based on a simple measuring principle. In order to measure reliably on a nanometer scale, however, a sophisticated instrument design is required.
In practice, this usually also implies a complex user interface. Users are often expected to deal with complicated settings; they should have prior knowledge of AFM technology and need a substantial amount of time for their measurements. But does a sophisticated instrument necessarily have to imply complex usability? Find out which aspects you should consider when choosing an AFM!
Download the whitepaper here!