Multiscale and Multimodal Correlative Microscopy Workflows
New Application Perspectives Using Light, Electron and X-Ray Microscopy
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The ability to efficiently and reliably locate and image an area of interest in a larger three dimensional sample remains a very challenging application in advanced microscopy. Approaches to address this issue include dedicated sample preparation steps to cut out the target area, or optical penetration using dedicated confocal systems. Both approaches are labor intense and cannot be automated easily. With X-ray microscopy, a new technology has evolved that shows a huge potential to bridge the gap between light and electron microscopy. Zeiss recently acquired the unique technologies of Xradia to offer integrated workflow solutions for life sciences and materials research.