Nov. 17, 2017

Pushing the Speed Boundaries of Scanning Electron Microscopy

To Boldly Answer Questions No One Ever Dared to Ask

  • Sample courtesy of Jeff Lichtman, Department of Molecular and Cellular Biology, Harvrad University, Cambridge, United StatesSample courtesy of Jeff Lichtman, Department of Molecular and Cellular Biology, Harvrad University, Cambridge, United States

The last few decades in scanning electron microscopy development were mainly dedicated to achieving higher resolution and more sophisticated detection capabilities. However, acquisition speed improvements were not the focus and the time to take images essentially remained the same. Contextual, large-scale imaging across multiple length scales has therefore been hindered by either throughput limitations of high-resolution techniques or, in turn, by resolution limitations of high-throughput imaging tools. This has been changed with the advent of the first commercial multi-beam scanning electron microscope: Zeiss MultiSEM. This new concurrent high-throughput and high-resolution imaging is opening new and exciting fields of research.

Read the complete article: here

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Dr. Anna Lena Eberle

Carl Zeiss Microscopy GmbH
Oberkochen, Germany


Carl Zeiss Microscopy GmbH
Carl-Zeiss-Promenade 10
07745 Jena
Phone: +49 3641 64-0
Telefax: +49 3641 64-2941

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