Read & Win: Aberration-Corrected Analytical Electron Microscopy
The book, intend for relative newcomers to the subject, is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. Of specific note is the chapter entitled ‘Details of STEM’, which deals with a host of nasty questions and awkward points that are very rarely discussed and is relevant to anyone who is unsure of his or her knowledge of the practical aspects of the STEM. The concluding chapter is a readable and well-informed account of Aberration-corrected Imaging in CTEM. Essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
Win the book!
To have a chance of winning the book read Issue 4, 2017 of Imaging & Microscopy (page 14 ). As a subscriber you could read the issue already online or order you own copy (as a free trial copy). Take part in our competition and send your answer to email@example.com with the subject line Read & Win. All correct answers will be entered in a prize draw and the lucky winner will receive a copy of "Aberration-Corrected Analytical Electron Microscopy".
Closing date: March 26, 2018.
holds a chair in Nanostructural Materials Characterisation at the University of Leeds & possesses > 30 years research experience in analytical electron microscopy of engineering materials and is currently applying these techniques to soft matter. He was involved in setting up SuperSTEM, the UK aberration corrected microscopy facility at Daresbury Laboratories and is currently Honorary Secretary Physical Sciences of the Royal Microscopical Society.
Interview with Rick Brydson:
What is your main focus in research, what is your main scientific interest?
Brydson: Combined Chemical and Structural analysis of hard and soft materials at high spatial resolution.
What was the reason to write the book?
Brydson: The correction of lens aberrations has revolutionized imaging and analysis in electron microscopy, it seemed a good time for the SuperSTEM team to summarise the subject from the perspective of scanning transmission electron microscopy (the most widely applied version of the technology).
What is the target audience for the book?
Brydson: Research students and scientists who are using beginning to use the technique in their research project.
What knowledge is prerequisite for the book?
Brydson: Some basic knowledge of electron microscopy.
What is the structure of the book?
Brydson: Some early introductory chapters followed by more detailed chapters on the instrument itself, imaging, analysis together with a snapshot of applications.
Tell us about the implications of the book for future research on this method, its practice and theory.
Brydson: It should provide a basic foundation for serious users of the technique.
If you think about the scientific achievements of the focused methods, which one would be the greatest in your opinion?
Brydson: Atomic resolution chemical analysis of solid materials
Where do you see the discussed technology in 10 years?
Brydson: In virtually all electron microscopes (provided the maintenance costs are not too high)!
Aberration-corrected Analytical Electron Microscopy
Edited by Rik Brydson
296 pages/ September 2011 / hardcover
Wiley / Series: RMS - Royal Microscopical Society
Available as hardcover and e-book