Read & Win: Conductive Atomic Force Microscopy
Conductive Atomic Force Microscopy (CAFM) is one of the most important techniques in the field of electronic properties of thin insulators and semiconductors. This book is the first one to provide a reference manual for researchers using CAFM in studying nanomaterials, which concentrates in the study of electronic properties of nanostructured materials and devices at the nanoscale. It encompasses the description of novel strategies, configurations and setups based on CAFM that allow perform enhanced measurements. The chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.
Win the book!
To have a chance of winning the book read Issue 2, 2018 of Imaging & Microscopy (page 12). As a subscriber you could read the issue already online or order you own copy (as a free trial copy). Take part in our competition and send your answer to firstname.lastname@example.org with the subject line Read & Win. All correct answers will be entered in a prize draw and the lucky winner will receive a copy of "Conductive Atomic Force Microscopy".
Closing date: September 25, 2018.
Dr. Mario Lanza
is a Professor in nanoelectronics and Young 1000 Talent scholar at Soochow University. He got his PhD in Electronic Engineering in 2010 at the Autonomous University of Barcelona. He was postdoc fellow at Pekin University, and also at Stanford University. His group is expert on nanoscale electrical studies of thin dielectrics using conductive atomic force microscopy.
Interview with Mario Lanza:
What is your main focus in research, what is your main scientific interest?
Lanza: I am interested on nanoelectronic devices (e.g.
field effect transistors, capacitors and memristors) and nanoelectronic properties of advanced materials (ultra thin dielectrics and two dimensional materials). I normally use conductive atomic force microscopy (CAFM) because it is the most powerful and versatile tool to analyze electrical currents at the nanoscale.
What was the reason to write the book?
Lanza: The need for summarizing the most relevant knowledge in the field of CAFM. This technique was invented in 1993, and this is the first project compiling the most important contributions developed during the last 25 years.
What is the target audience for the book?
Lanza: Anyone working with micro and nanoelectronics. The book will be useful for CAFM users to find very technical knowledge on how to carry out their experiments and analyze their data correctly. And also it will be useful for researchers who never used CAFM, as it provides the key knowledge to understand how CAFM can help them to expand their research skills in nanoelectronics.
What knowledge is prerequisite for the book?
Lanza: Anybody with basic knowledge in electronics could benefit from the book. Despite being an extremely powerful tool for, CAFM has a very basic working principle.
What is the structure of the book?
Lanza: The book contains a preface written by Prof. Sean Joseph O’Shea, one of the inventors of the CAFM. Chapter 1 introduces the history and status of CAFM. And the rest of chapters are written by CAFM experts, who describe not only experimental considerations about the CAFM, but also the most impactful case studies.
What will be – in your opinion – the “next big thing” in CAFM?
Lanza: CAFM scientists are waiting for multiprobe CAFM. There is already one company that already offers this possibility, but he hardware is still too complex and it needs to be optimized. As the dimensions of electronic devices are reduced, multiprobe CAFM will be the next probe station. In the future multiprobe CAFM would be an essential tool for research.
How important is automation when it comes to analyzing the data obtained from the experiment?
Lanza: CAFM data analysis requires understanding extremely carefully the way in which it has been obtained, in a sequential way. There is little room for automation, but still some specific set of data (such as groups of current vs. voltage curves) could be automatically analyzed via software.
Conductive Atomic Force Microscopy
Applications in Nanomaterials
Lanza, Mario (ed.)
1. Edition October 2017
362 Pages, Hardcover