Aug. 06, 2015
News

Using a Scanning Tunnelling Microscope for Analyzing Extremely Conductive Surfaces

  • Close-up view of the specifically equipped scanning tunnelling microscope. (Copyright: Forschungszentrum Jülich)Close-up view of the specifically equipped scanning tunnelling microscope. (Copyright: Forschungszentrum Jülich)

Materials Science: Silicon is by far the most extensively used material in the semiconductor industry. However, its electronic properties have still not been fully explored. On its surface, electric current is conducted up to one thousand times better than in the bulk. Precisely how much better has now been determined with unprecedented accuracy by Jülich scientists using a specifically equipped scanning tunnelling microscope.

Original publication:
Sven Just, Marcus Blab, Stefan Korte, Vasily Cherepanov, Helmut Soltner, Bert Voigtländer: Surface and Step Conductivities on Si(111) Surfaces, Phys. Rev. Lett. 115, 066801 (2015)

More information:
http://www.fz-juelich.de/

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