Mar. 15, 2018ProductsElectron and Ion Microscopy
The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely ...
Mar. 14, 2018ProductsElectron and Ion Microscopy
High quality sectioning of specimens for light, electron, and atomic force microscopy examination has never been easier and more precise. Leica Microsystems introduces its latest specimen preparation technology: the Leica EM UC7 ...
Nov. 02, 2017ProductsElectron and Ion Microscopy
Zeiss presents the new generation of its proven high performance scanning electron microscope (SEM).
Oct. 30, 2017ProductsElectron and Ion Microscopy
The Leica EM VCM enables users to easily put their cryogenic samples on holders under liquid nitrogen. Features such as an adjustable LED illumination, an adequate magnifier, or a tool dryer contribute to conveniently handle the sample. ...
Oct. 26, 2017ProductsElectron and Ion Microscopy
Fully reproducible high class results with maximum resolution: The Leica EM ACE900 is a high-end sample preparation system. Perform freeze fracture, freeze etching, and e-beam coating in one instrument.
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