The High Speed, Sensitivity And Dynamic Range Will Enable Multichannel Atomic-Scale Imaging And Analysis Of Material Properties
The high speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields not previously possible. The electron microscope pixel array detector (EMPAD) simultaneously captures the spatially and angularly-resolved distribution of all transmitted electrons, allowing acquisition of scattering information to generate images and analytical results in scanning transmission electron microscope (STEM) applications.
Statement of Prof. David Muller, School of Applied and Engineering Physics, Cornell University
"The EMPAD records an image frame in less than a millisecond and can detect from 1 to 1,000,000 primary electrons per pixel, per image frame"
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