Ion Beam Preparation of Samples for SEM

One of the most-read Application Booklets in 2018

  • Specialists from Leica Microsystems have collected over 20 different examples featuring different samples for SEM in one booklet.Specialists from Leica Microsystems have collected over 20 different examples featuring different samples for SEM in one booklet.

Download this 76-pages booklet today and learn how to improve your processes

In this booklet you can find information about how ion beam milling can help you to:

  • Generate cross sectional sample preparation for different materials (semiconductor, metal, stones, paper/wood materials and thermally sensitive samples)
  • Clean sample surfaces and set contrast enhancement
  • Process large sample surfaces
  • Prepare samples for EBSD

Today, ion beam milling is one of the most widely-used methods for preparing samples for electron microscopy. During this process, the sample material is bombarded with a high-energy argon-ion beam to achieve high quality cross-sections and planed surfaces whilst minimizing deformation or damage.

One can clean, polish or adjust the contrast of these surfaces to optimize them for subsequent imaging in the scanning electron microscope.

The booklet is available in English or in German and can be downloaded here.

Contact

Leica Microsystems GmbH
Ernst-Leitz-Str. 17-37
D-35578 Wetzlar
Germany
Phone: +49 6441 29 4000
Telefax: +49 6441 29 4155

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