Leica EM TIC3X – Ion Beam Slope Cutter

High Quality Surface Finishing For Almost Any Material

  • Leica EM TIC 3X - Ion beam slope cutterLeica EM TIC 3X - Ion beam slope cutter

The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. With the Leica EM TIC 3X you achieve high quality surfaces of almost any material at room temperature or cryo, revealing the internal structures of the sample in a near native state as possible.

The flexible choice of stages makes the Leica EM TIC 3X a perfect instrument not only for high through put but also for contract laboratories. Depending on your needs the Leica EM TIC 3X can be configured individually using interchangeable stages like standard stage, multiple sample stage, rotary stage or cooling stage for applications of standard preparation, high throughput processing, as well as the preparation of extremely heat sensitive samples such as polymers, rubbers or biological materials at low temperature. Connectivity with the Leica EM VCT environmental transfer system provides perfect cryogenic surfacing of biological, geological, or industrial samples subsequently transferred under cryo and vacuum conditions to coater and (cryo) SEM.

  • Cuts high-quality cross-sections with large areas of 4 > 1 mm
  • Multiple sample stage capable of processing several samples in one run
  • Samples up to a size of 50 x 50 x 10 mm or up to 38 mm diameter can be inserted for processing
  • Easy and accurate sample mounting and alignment
  • Simple operation via touch-screen, no special skills necessary
  • Process monitoring via stereomicroscope or HD-TV camera
  • Four segement controlled LED illumination for optimal specimen viewing and alignment
  • Integrated, decoupled roughing pump provides vibration-free observation
  • Contrast enhancement at 90° to the prepared surface
  • Usable for almost any material, cooling stage provides temperatures of mask and sample down to -160 °C
  • Parameter and programme upload and download on USB stick
  • Total workflow solution saves user interaction time

Visit the Leica Microsite to discover more!

 

Contact

Leica Microsystems GmbH
Ernst-Leitz-Str. 17-37
D-35578 Wetzlar
Germany
Phone: +49 6441 29 4000
Telefax: +49 6441 29 4155

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