Dec. 22, 2017ProductsScanning Probe Microscopy
WITec, industry-leading manufacturer of Raman imaging and correlative microscopy systems, has started shipping its Suite Five data acquisition, evaluation and processing software with the new ability to compensate for thermal and ...
Dec. 21, 2017ProductsLight Microscopy
PicoQuants FluoTime 300 fluorescence lifetime spectrometer is now available with double monochromators in excitation and emission. Due to the very high stray light rejection of these monochromators, the signal to noise ratio of the ...
Nov. 30, 2017ProductsLight Microscopy
Coherent´s Chameleon Discovery laser with Total Power Control is the first one-box turnkey laser for multiphoton excitation (MPE) microscopy to include built-in, high-speed power modulation. Based on the latest acousto-optic (AO) ...
Nov. 24, 2017ProductsLight Microscopy
The TopoMAPS software for SEM image enhancement, 3D reconstruction and metrology from Digital Surf is now available on Thermo Scientific SEM and DualBeam systems.
Nov. 13, 2017ProductsLight Microscopy
The Olympus Fluoview 3000 confocal laser scanning microscope is designed to reach the limits of precision and achieve unprecedented detail, both in live-cell and in fixed tissue imaging. With a maximum resolution of 120 nm and 16-channel ...
Nov. 02, 2017ProductsImage Processing
The leading scientific equipment manufacturing company Anton Paar is announcing the launch of Tosca analysis software, based on Digital Surf’s Mountains surface analysis technology.
Nov. 02, 2017ProductsElectron and Ion Microscopy
Zeiss presents the new generation of its proven high performance scanning electron microscope (SEM).
Nov. 02, 2017ProductsLight Microscopy
Excelitas Technologies proudly presents X-Cite Fire, the next generation X-Cite fluorescence illumination system. X-Cite Fire has the broadest spectrum available in a white light LED for fluorescence microscopy and rivals traditional arc ...
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Microscopy & Analysis
Presents current trends in microscopy instrumentation and application.