Oct. 17, 2018ProductsScanning Probe Microscopy
Park NX-Wafer is a revolutionary AFM solution designed for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.
Jul. 31, 2018ProductsScanning Probe Microscopy
Hitachi High-Technologies Corporation announced that it will launch the SU7000, a Schottky field emission scanning electron microscope (FE-SEM) that incorporates a large specimen chamber, enhanced versatility, and high throughput with ...
Nov. 22, 2017ProductsScanning Probe Microscopy
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
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