Nov. 22, 2017ProductsScanning Probe Microscopy
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
The latest information directly via newsletter.
Follow Imaging & Microscopy on Twitter.
Whether your goal is to Build Brands, Increase Traffic or Generate Leads, Imaging & Microscopy is a unique opportunity to reach a huge european audience. Want to download the complete Media Kit?