Oct. 30, 2019ProductsScanning Probe Microscopy
WITec’s solution for correlative Raman-SEM imaging is now available for Zeiss Sigma 300, a field emission scanning electron microscope (FE-SEM). With this jointly-developed system, WITec and Zeiss have furthered their collaboration ...
The Tosca series consists of Tosca 400, a large-sample, premium AFM, and Tosca 200, an AFM for medium-sized samples and budget-sensitive research. Both devices feature the same high level of automation, increasing the efficiency and ...
Oct. 11, 2019ProductsScanning Probe Microscopy
Did you know that performing nanoscale measurements in High Vacuum significantly improves the sensitivity and resolution of the acquired data and enhanced the material analysis? Because high vacuum scanning offers greater accuracy and ...
Sep. 23, 2019ProductsScanning Probe Microscopy
Prior Scientific announced the release of its new PureFocus 850 a revolutionary autofocus for biological and industrial imaging. The PureFocus 850 is a fast, precise and accurate focusing system that has been design to fit both ...
Prior Scientific announced the release of the NanoScan OP400, a piezo based objective scanner. Prior Scientific acquired Queensgate in 2018 and the NanoScan OP400 ...
Oct. 17, 2018ProductsScanning Probe Microscopy
Park NX-Wafer is a revolutionary AFM solution designed for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.
Nov. 22, 2017ProductsScanning Probe Microscopy
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
The latest information directly via newsletter.
Follow us on Twitter
Imaging & Microscopy
High valuable content focused on methodology and academic research.
Download the media kit 2020 here
Microscopy & Analysis
Presents current trends in microscopy instrumentation and application.