Sep. 16, 2018News
The NanoScientific Forum Europe (NSFE 2018) is an exciting new opportunity for scientists to present their latest AFM/SPM research papers to leading researchers and peers from both academia and industry.
Sep. 10, 2018Science
Ultrasound is combined with atomic force microscopy to achieve the lateral resolution of scanning probe techniques for ultrasonic imaging and quantitative local elasticity and damping measurements by exploiting the contact resonances of ...
Jul. 26, 2018News
Park Systems, a manufacturer of atomic force microscopes (AFM) awarded the Park Systems AFM Scholarships to two new young scientists from Europe:
1st Prize goes to Nasim Bosh from HFU Furtwangen, Campus Tuttlingen, Germany
2nd Prize goes ...
Jul. 19, 2018News
In the quest to realize artificial photosynthesis to convert sunlight, water, and carbon dioxide into fuel – just as plants do – researchers need to not only identify materials to efficiently perform photoelectrochemical water ...
Jun. 22, 2018News
Conductive Atomic Force Microscopy (CAFM) is one of the most important techniques in the field of electronic properties of thin insulators and semiconductors. This book is the first one to provide a reference manual for researchers using ...
Jun. 18, 2018Science
Atomic Force Microscopes (AFM), once typically found in the basements of physics’ schools, are now beginning to populate life sciences research centers. Undeniably, the rise of mechanobiology research has found an ideal partner in ...
May. 27, 2018Webcast
Using a new mode of atomic force microscopy, researchers at EPFL have found a way to see and measure protein assembly in real time and with unprecedented detail (more).
Interested in this instrument? Come and make your own!
May. 25, 2018News
Using a new mode of atomic force microscopy, researchers at EPFL have found a way to see and measure protein assembly in real time and with unprecedented detail.
Mar. 15, 2018Products
The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
Mar. 14, 2018Products
High quality sectioning of specimens for light, electron, and atomic force microscopy examination has never been easier and more precise. Leica Microsystems introduces its latest specimen preparation technology: the Leica EM UC7 ...
The latest information directly via newsletter.