Jan. 02, 2019Science
Microscopy typically comes in one of two flavors, providing either structural detail or functional context. Rarely does a microscopy technique bridge the void of form-to-function as well as high-speed-AFM. Augmenting this with nanoscale ...
Dec. 18, 2018News
Park Systems, the technological leader in atomic force microscopy (AFM) solutions for academia and industry sectors, is proud to award for the second time this year an European young scientist the Park Systems AFM Scholarship!
Nov. 30, 2018News
After the successful first edition of NanoScientific Forum Europe (NSFE) in October 2018 at the TU Freiberg, Germany Park Systems is happy to invite scientists and researchers working in the field of Atomic Force Microscopy to beautiful ...
Nov. 16, 2018News
Since its invention in 1986, atomic force microscopy (AFM) has emerged as a powerful tool to probe materials, structures, and devices at the nanoscale. In recent years, empowered by advanced data acquisition hardware and sophisticated data ...
Nov. 09, 2018Applications
Electromechanical coupling in materials is a key property that provides functionality to a variety of applications including: sensors, actuators, IR detectors, energy harvesting, and biology.
Oct. 17, 2018Products
Park NX-Wafer is a revolutionary AFM solution designed for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.
Sep. 25, 2018News
The NanoScientific Forum Europe (NSFE 2018), hosted at TU Bergakademie Freiberg and sponsored by Park Systems & NanoScientific Journal, is an exciting new opportunity for scientists to present their latest AFM/SPM research projects to ...
Sep. 16, 2018News
The NanoScientific Forum Europe (NSFE 2018) is an exciting new opportunity for scientists to present their latest AFM/SPM research papers to leading researchers and peers from both academia and industry.
Sep. 10, 2018Science
Ultrasound is combined with atomic force microscopy to achieve the lateral resolution of scanning probe techniques for ultrasonic imaging and quantitative local elasticity and damping measurements by exploiting the contact resonances of ...
Jul. 26, 2018News
Park Systems, a manufacturer of atomic force microscopes (AFM) awarded the Park Systems AFM Scholarships to two new young scientists from Europe:
1st Prize goes to Nasim Bosh from HFU Furtwangen, Campus Tuttlingen, Germany
2nd Prize goes ...
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