Jun. 22, 2018News
Conductive Atomic Force Microscopy (CAFM) is one of the most important techniques in the field of electronic properties of thin insulators and semiconductors. This book is the first one to provide a reference manual for researchers using ...
Jun. 18, 2018Science
Atomic Force Microscopes (AFM), once typically found in the basements of physics’ schools, are now beginning to populate life sciences research centers. Undeniably, the rise of mechanobiology research has found an ideal partner in ...
May. 27, 2018Webcast
Using a new mode of atomic force microscopy, researchers at EPFL have found a way to see and measure protein assembly in real time and with unprecedented detail (more).
Interested in this instrument? Come and make your own!
May. 25, 2018News
Using a new mode of atomic force microscopy, researchers at EPFL have found a way to see and measure protein assembly in real time and with unprecedented detail.
Mar. 15, 2018Products
The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
Mar. 14, 2018Products
High quality sectioning of specimens for light, electron, and atomic force microscopy examination has never been easier and more precise. Leica Microsystems introduces its latest specimen preparation technology: the Leica EM UC7 ...
Feb. 14, 2018News
Park Systems, a manufacturer of Atomic Force Microscopes celebrated the grand opening of their European Headquarters on February 6, 2018 in Mannheim, Germany. The new office will serve as a central European AFM research facility, ...
Dec. 22, 2017Products
WITec, industry-leading manufacturer of Raman imaging and correlative microscopy systems, has started shipping its Suite Five data acquisition, evaluation and processing software with the new ability to compensate for thermal and ...
Dec. 01, 2017News
A team of scientists working at the University of Bristol have developed a new nanomapping microscope - powered by the laser and optics found in a typical DVD player. The new technology is being used to transform the way disease-causing ...
Nov. 22, 2017Products
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
The latest information directly via newsletter.