Mar. 15, 2018Products
The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
Mar. 14, 2018Products
High quality sectioning of specimens for light, electron, and atomic force microscopy examination has never been easier and more precise. Leica Microsystems introduces its latest specimen preparation technology: the Leica EM UC7 ...
Feb. 14, 2018News
Park Systems, a manufacturer of Atomic Force Microscopes celebrated the grand opening of their European Headquarters on February 6, 2018 in Mannheim, Germany. The new office will serve as a central European AFM research facility, ...
Dec. 22, 2017Products
WITec, industry-leading manufacturer of Raman imaging and correlative microscopy systems, has started shipping its Suite Five data acquisition, evaluation and processing software with the new ability to compensate for thermal and ...
Dec. 01, 2017News
A team of scientists working at the University of Bristol have developed a new nanomapping microscope - powered by the laser and optics found in a typical DVD player. The new technology is being used to transform the way disease-causing ...
Nov. 22, 2017Products
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
Nov. 20, 2017Science
Hydrophobins are fungal proteins with many potential applications due to their ability to self-assemble into amphipathic films at hydrophobic:hydrophillic interfaces. The ability to manipulate surface characteristics of hydrophobin films ...
Nov. 07, 2017News
Park Systems, a provider of Atomic Force Microscopes (AFM), announces the opening of the Park NanoScience Center at the State University of New York Polytechnic Institute (SUNY Poly), one of the world’s most advanced high-tech ...
Nov. 02, 2017Products
The leading scientific equipment manufacturing company Anton Paar is announcing the launch of Tosca analysis software, based on Digital Surf’s Mountains surface analysis technology.
Oct. 06, 2017News
Oak Ridge National Laboratory scientists have developed a technique for making ultrafast measurements using atomic force microscopy, which previously could only investigate slow or static material structures and functions.
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