AFM | Imaging & Microscopy - Research, Development, Production

Oct. 25, 2016
News
Tailored Probes for Atomic Force Microscopes
Atomic force microscopes make the nanostructure of surfaces visible. Their probes scan the investigation material with finest measurement needles. KIT has succeeded in adapting these needles to the application. For any measurement task, ...
Oct. 19, 2016
News
Nanowires as Sensors in New Type of Atomic Force Microscope
A new type of atomic force microscope (AFM) uses nanowires as tiny sensors. Unlike standard AFM, the device with a nanowire sensor enables measurements of both the size and direction of forces. Physicists at the University of Basel and at ...
Oct. 18, 2016
News
Crystal Clear Imaging: Infrared Brings to Light Nanoscale Molecular Arrangement
Detailing the molecular makeup of materials—from solar cells to organic light-emitting diodes (LEDs) and transistors, and medically important proteins—is not always a crystal-clear process. To understand how materials work ...
Oct. 04, 2016
Science
Surface Roughness of Restorative Materials after Tooth Whitening
This in vitro study was conducted to evaluate the effect of tooth whitening on the surface roughness of dental restorative materials using AFM. Two hybrid resin composites and nano-ionomer were fabricated in samples with 2 mm ...
Sep. 19, 2016
Applications
AFM Tools for Nanoscale Electrical Characterization
This application note discusses the unique nanoelectrical characterization tools and techniques of Asylum Research Cypher and MFP-3D AFMs for a wide range of applications. Read the complete application note: here.
Sep. 06, 2016
Products
Deben MICROTEST 200N Tensile Stage
The MICROTEST range of tensile, compression and bending stages is available for SEM, optical microscopy, AFM and XRD applications. The Deben 200N stage uses load cells within the range 2N to 200N. Samples are mounted clamped to a pair of ...
Aug. 31, 2016
News
2016 Kavli Prize: A Discussion with Gerd Binning and Christoph Gerber
The 2016 Kavli Prize laureates discuss how the ability to see and manipulate single molecules and atoms has changed our view of the nanoscale world. Thirty Years Ago, Gerd Binnig, Christoph Gerber and Calvin Quate began developing a ...
Aug. 09, 2016
Science
Connective Tissue: Diagnosis by AFM
We have applied atomic force microscopy (AFM) to diagnose morphological changes in the extracellular matrix of connective tissue caused by different pathological processes. Notable deviations from the normal morphology were found in ...
Aug. 08, 2016
News
New Online Probe Store to Purchase Atomic Force Microscopy Probes
Oxford Instruments Asylum Research announces its new AFM Probe Store, which features a complete range of probes, a convenient interface to select and purchase probes, and interactive customer support: https://AFMprobes.AsylumResearch.com. ...
Aug. 03, 2016
Products
Discover More: With Stability, with Ease, with Hitachi
EMC2016 is the perfect place to see what’s new and exciting from Hitachi and to discuss your microscopy needs. We’ll be showcasing a wide range of instrumentation including the new HF5000 200kV TEM (pictured).

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