Jan. 08, 2019Products
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In this booklet you can find information about how ion beam milling can help you to:
May. 19, 2014Science
High energy focused ion beam (FIB) milling produces ion-induced damage into TEM samples and a certain amount of Ga ions implantation cannot be avoided. Additional polishing of FIB lamellae at low voltages can damage the sample further. To ...
Jul. 22, 2013Science
We explore the potential of a novel imaging method to exploit differential susceptibility of biological tissue to erosion by Focused Ion Beam (FIB) milling. The contents of a given cell (nucleus, Golgi apparatus, vacuoles) have different ...
Jun. 01, 2008Science
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