large sample | Imaging & Microscopy - Research, Development, Production

Nov. 22, 2017
Products
Park NX20 300mm AFM: A Nano Metrology Tool for Failure Analysis and Large Sample Scans
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
Aug. 03, 2016
Products
Tescan: Performance in Nanospace
Tescan is a multi-national company and a leading global developer and supplier of scanning electron microscopes (SEMs), focused ion beam scanning electron microscope (FIB-SEM) systems, unique solutions for SEM and FIB-SEM ...
Aug. 03, 2016
Products
Raith´s CHIPSCANNER – True Large-Area Image Acquisition
The CHIPSCANNER from Raith uniquely combines high-resolution electron optics, multiple, highly efficient electron detectors and most precise Laser interferometer Stage technology.
Jul. 22, 2016
Products
Tescan Introduces Triglav - a new Ultra-High Resolution Electron Column Technology
Tescan has introduced Triglav a ultra-high resolution (UHR) electron column technology with significant improvement in quality imaging and analytical capabilities. ...
Jan. 13, 2010
Products
Atomic Resolution
Bruker Nano announced that its N8 Titanos large-sample inspection AFM has been further improved to provide high spatial resolving power. Due to its AFM technology and mechanical stability, the AFM has now been demonstrated with ...

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