Nov. 22, 2017Products
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
Aug. 03, 2016Products
Tescan is a multi-national company and a leading global developer and supplier of scanning electron microscopes (SEMs), focused ion beam scanning electron microscope (FIB-SEM) systems, unique solutions for SEM and FIB-SEM ...
The CHIPSCANNER from Raith uniquely combines high-resolution electron optics, multiple, highly efficient electron detectors and most precise Laser interferometer Stage technology.
Jul. 22, 2016Products
Tescan has introduced Triglav a ultra-high resolution (UHR) electron column technology with significant improvement in quality imaging and analytical capabilities.
Jan. 13, 2010Products
Bruker Nano announced that its N8 Titanos large-sample inspection AFM has been further improved to provide high spatial resolving power. Due to its AFM technology and mechanical stability, the AFM has now been demonstrated with ...
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