Dec. 18, 2018News
Park Systems, the technological leader in atomic force microscopy (AFM) solutions for academia and industry sectors, is proud to award for the second time this year an European young scientist the Park Systems AFM Scholarship!
Nov. 22, 2017Products
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
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