Jul. 22, 2019Applications
Park AFM Scholarship Awards are open to undergraduate or postdoctoral students. Through this program, Park Systems has offered assistance to many researchers around the world who qualify as Park AFM Scholars by matching them with one of ...
Jun. 12, 2019News
Park Systems Europe, as a leading nanoscientific company devoted to innovative science and nanotechnology, is proud to contribute to the research growth in Europe, and dedicates a remarkable discount to all academic research facilities in ...
May. 14, 2019Applications
Scanning Kelvin Probe microscopy (SKPM) allows measuring work function and electrical potential distribution of various materials, to provide a better understanding of nanostructures and CMOS semiconductor devices to improve their ...
Apr. 17, 2019News
Share your research with the AFM community of Europe and submit an abstract at the 2nd NanoScientific Forum Europe (NSFE2019) to be held at University of Bologna Sept. 11-13, 2019.
Mar. 18, 2019News
As a fast-paced manufacturer of nanoscale microscopy and metrology products, Park Systems expends its leadership in Europe by establishing Park Systems France. The new European office will serve French, Spanish and Portuguese research ...
Dec. 18, 2018News
Park Systems, the technological leader in atomic force microscopy (AFM) solutions for academia and industry sectors, is proud to award for the second time this year an European young scientist the Park Systems AFM Scholarship!
Nov. 30, 2018News
After the successful first edition of NanoScientific Forum Europe (NSFE) in October 2018 at the TU Freiberg, Germany Park Systems is happy to invite scientists and researchers working in the field of Atomic Force Microscopy to beautiful ...
Nov. 26, 2018Applications
Since the inception of scanning tunneling microscopy (STM) , electrochemists applied the scanning probe microscopy (SPM) technique to develop scanning electrochemical microscopy (SECM), also known as the chemical microscopy.
Nov. 09, 2018Applications
Electromechanical coupling in materials is a key property that provides functionality to a variety of applications including: sensors, actuators, IR detectors, energy harvesting, and biology.
Oct. 17, 2018Products
Park NX-Wafer is a revolutionary AFM solution designed for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.
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