Park Systems | Imaging & Microscopy - Research, Development, Production

Jun. 12, 2019
News
Park Systems Europe announces: 33 Years of AFM – 33% OFF on your NEXT AFM
Park Systems Europe, as a leading nanoscientific company devoted to innovative science and nanotechnology, is proud to contribute to the research growth in Europe, and dedicates a remarkable discount to all academic research facilities in ...
May. 14, 2019
Applications
Enhanced Surface Potential Detection using Frequency Modulation SKPM
Scanning Kelvin Probe microscopy (SKPM) allows measuring work function and electrical potential distribution of various materials, to provide a better understanding of nanostructures and CMOS semiconductor devices to improve their ...
Apr. 17, 2019
News
Contribute to the AFM Event of the Year - NSFE 2019
Share your research with the AFM community of Europe and submit an abstract at the 2nd NanoScientific Forum Europe (NSFE2019) to be held at University of Bologna Sept. 11-13, 2019.
Mar. 18, 2019
News
Park Systems expands with a new subsidiary, Park Systems France
As a fast-paced manufacturer of nanoscale microscopy and metrology products, Park Systems expends its leadership in Europe by establishing Park Systems France. The new European office will serve French, Spanish and Portuguese research ...
Dec. 18, 2018
News
Park Systems AFM Scholarship Awards
Park Systems, the technological leader in atomic force microscopy (AFM) solutions for academia and industry sectors, is proud to award for the second time this year an European young scientist the Park Systems AFM Scholarship! ...
Nov. 30, 2018
News
Park Systems and University of Bologna are Proud to Announce the 2nd NanoScientific Forum Europe ...
After the successful first edition of NanoScientific Forum Europe (NSFE) in October 2018 at the TU Freiberg, Germany Park Systems is happy to invite scientists and researchers working in the field of Atomic Force Microscopy to beautiful ...
Nov. 26, 2018
Applications
Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy
Since the inception of scanning tunneling microscopy (STM) [1], electrochemists applied the scanning probe microscopy (SPM) technique to develop scanning electrochemical microscopy (SECM), also known as the chemical microscopy.
Nov. 09, 2018
Applications
Revolution in Piezoelectric Force Microscopy – PinPoint PFM
Electromechanical coupling in materials is a key property that provides functionality to a variety of applications including: sensors, actuators, IR detectors, energy harvesting, and biology.
Oct. 17, 2018
Products
NX-Wafer - Your Solution for Semiconductor Wafer Production
Park NX-Wafer is a revolutionary AFM solution designed for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.
Sep. 25, 2018
News
NanoScientific Forum Europe (NSFE) on AFM/SPM at TU Freiberg, Germany
The NanoScientific Forum Europe (NSFE 2018), hosted at TU Bergakademie Freiberg and sponsored by Park Systems & NanoScientific Journal, is an exciting new opportunity for scientists to present their latest AFM/SPM research projects to ...

12

Register now!

The latest information directly via newsletter.

GIT Verlag