Park Systems | Imaging & Microscopy - Research, Development, Production

Dec. 18, 2018
News
Park Systems AFM Scholarship Awards
Park Systems, the technological leader in atomic force microscopy (AFM) solutions for academia and industry sectors, is proud to award for the second time this year an European young scientist the Park Systems AFM Scholarship! ...
Nov. 30, 2018
News
Park Systems and University of Bologna are Proud to Announce the 2nd NanoScientific Forum Europe ...
After the successful first edition of NanoScientific Forum Europe (NSFE) in October 2018 at the TU Freiberg, Germany Park Systems is happy to invite scientists and researchers working in the field of Atomic Force Microscopy to beautiful ...
Nov. 26, 2018
Applications
Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy
Since the inception of scanning tunneling microscopy (STM) [1], electrochemists applied the scanning probe microscopy (SPM) technique to develop scanning electrochemical microscopy (SECM), also known as the chemical microscopy.
Nov. 09, 2018
Applications
Revolution in Piezoelectric Force Microscopy – PinPoint PFM
Electromechanical coupling in materials is a key property that provides functionality to a variety of applications including: sensors, actuators, IR detectors, energy harvesting, and biology.
Oct. 17, 2018
Products
NX-Wafer - Your Solution for Semiconductor Wafer Production
Park NX-Wafer is a revolutionary AFM solution designed for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.
Sep. 25, 2018
News
NanoScientific Forum Europe (NSFE) on AFM/SPM at TU Freiberg, Germany
The NanoScientific Forum Europe (NSFE 2018), hosted at TU Bergakademie Freiberg and sponsored by Park Systems & NanoScientific Journal, is an exciting new opportunity for scientists to present their latest AFM/SPM research projects to ...
Sep. 16, 2018
News
NanoScientific Forum Europe NSFE 2018
The NanoScientific Forum Europe (NSFE 2018) is an exciting new opportunity for scientists to present their latest AFM/SPM research papers to leading researchers and peers from both academia and industry.
Jul. 26, 2018
News
Park Systems AFM Scholarship Awards
Park Systems, a manufacturer of atomic force microscopes (AFM) awarded the Park Systems AFM Scholarships to two new young scientists from Europe: 1st Prize goes to Nasim Bosh from HFU Furtwangen, Campus Tuttlingen, Germany 2nd Prize goes ...
Feb. 14, 2018
News
Park Systems Holds Grand Opening Ceremony of the Park Nanoscience Lab at their European Headquarters
Park Systems, a manufacturer of Atomic Force Microscopes celebrated the grand opening of their European Headquarters on February 6, 2018 in Mannheim, Germany. The new office will serve as a central European AFM research facility, ...
Nov. 22, 2017
Products
Park NX20 300mm AFM: A Nano Metrology Tool for Failure Analysis and Large Sample Scans
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.

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