Park Systems | Imaging & Microscopy - Research, Development, Production

Dec. 04, 2019
News
3rd NanoScientific Forum Europe on September 23-25, 2020 at Trinity College Dublin, Ireland
The 3rd NanoScientific Forum Europe (NSFE 2020) will be hosted by Prof. Kim McKelvey, School of Chemistry at Trinity College Dublin, and by Prof. Brian Rodriguez, School of Physics at University College Dublin. The event is co-hosted and ...
Nov. 25, 2019
Applications
On the Advantages of High Vacuum Environments
Insights into morphological and electronic properties of two-dimensional materials at the nanometer-scale are of great interest to the industry due to the decreasing sizes of semiconductor devices. Complementary atomic force microscopy ...
Oct. 11, 2019
Products
Better in Vacuum
Did you know that performing nanoscale measurements in High Vacuum significantly improves the sensitivity and resolution of the acquired data and enhanced the material analysis? Because high vacuum scanning offers greater accuracy and ...
Sep. 24, 2019
Applications
Advantages of Vacuum for Electrical Scanning Probe Microscopy
Park Systems NX-Hivac allows failure analysis engineers and researchers to improve the sensitivity and resolution of their measurements through high vacuum scanning spreading resistance microscopy (SSRM). Because high vacuum scanning ...
Sep. 19, 2019
News
Park Systems Europe Announces: 33 Years of AFM – 33% OFF on your NEXT AFM
Park Systems Europe, as a leading nanoscientific company devoted to innovative science and nanotechnology, is proud to contribute to the research growth in Europe, and dedicates a remarkable discount to all academic research facilities in ...
Jul. 22, 2019
Applications
Park Systems AFM Scholarship Awards
Park AFM Scholarship Awards are open to undergraduate or postdoctoral students. Through this program, Park Systems has offered assistance to many researchers around the world who qualify as Park AFM Scholars by matching them with one of ...
May. 14, 2019
Applications
Enhanced Surface Potential Detection using Frequency Modulation SKPM
Scanning Kelvin Probe microscopy (SKPM) allows measuring work function and electrical potential distribution of various materials, to provide a better understanding of nanostructures and CMOS semiconductor devices to improve their ...
Apr. 17, 2019
News
Contribute to the AFM Event of the Year - NSFE 2019
Share your research with the AFM community of Europe and submit an abstract at the 2nd NanoScientific Forum Europe (NSFE2019) to be held at University of Bologna Sept. 11-13, 2019.
Mar. 18, 2019
News
Park Systems expands with a new subsidiary, Park Systems France
As a fast-paced manufacturer of nanoscale microscopy and metrology products, Park Systems expends its leadership in Europe by establishing Park Systems France. The new European office will serve French, Spanish and Portuguese research ...
Dec. 18, 2018
News
Park Systems AFM Scholarship Awards
Park Systems, the technological leader in atomic force microscopy (AFM) solutions for academia and industry sectors, is proud to award for the second time this year an European young scientist the Park Systems AFM Scholarship! ...

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