SDD | Imaging & Microscopy - Research, Development, Production

Aug. 02, 2016
Products
EDAX Introduces New Octane Elite and Element SDDs
EDAX is a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectrometry (EDS), Wavelength Dispersive Spectrometry (WDS), Electron Backscatter Diffraction (EBSD), X-ray Fluorescence (XRF), ...
Jul. 11, 2011
Applications
Analysis of Boron with Energy Dispersive X-ray Spectrometry
The analysis of light elements (from Be to F, refer to periodic table in fig. 1) presents a special challenge for energy dispersive X-ray spectrometry (EDS). Some of the problems are due to inherent physical effects, while others are ...
May. 04, 2011
Products
X-Ray Spectroscopy Enables Elemental Mapping at the Atomic-Level
FEI Company has announced that elemental mapping at the atomic-level is now possible across the periodic table using ChemiSTEM Technology. ...
Mar. 21, 2011
Products
Jeol Introduces Multi-Touch Screen Interface for Scanning Electron Microscopy
Jeol has announced that they now offer InTouch Scope, an analytical, low vacuum Scanning Electron Microscope (SEM) with integrated EDS analysis and multi-touch screen functionality.
Feb. 21, 2011
News
X-Max EDS-Detector from Oxford Instruments: 1000th was installed
Oxford Instruments has completed the installation of its 1000th X-Max:X-Max was introduced to the market over two years ago and was the world's first "Large Area" silicon drift detector with an effective sensor area of 80mm2. The ...
Feb. 02, 2011
Products
EDAX Introduces Apollo Silicon Drift Detector Series for TEM
EDAX released the Apollo Silicon Drift Detector (SDD) Series for the transmission electron microscope (TEM). The series includes the Apollo XLT with a Super Ultra Thin Window (SUTW) and the Apollo XLTW, a windowless version. ...
Mar. 31, 2010
Science
EDS Using an SDD with X-ray Optic
Organic and mineral samples, containing light elements like oxygen, nitrogen or beryllium have been analyzed using an attachable X-ray optic with an SDD in SEM. Compared to the measurements without the additional optic, there is a ...
Nov. 03, 2009
Applications
Nanoscience in SEM and TEM
The development of modern technology affects the science of small objects in two ways. On one hand better means for handling, imaging and analysis of miniature objects are provided, which means we can try and understand our world on a much ...
Jul. 01, 2007
News
Thomas Schülein opened EDS Microanalysis Colloquium in Berlin
Thomas Schülein opened EDS Microanalysis Colloquium in Berlin: Exciting new insights into EDS microanalysis were delivered at the colloquium "New developments in EDS Analysis at the Scanning Electron Microscope - 4th Generation Liquid ...

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