SEM | Imaging & Microscopy - Research, Development, Production

Jan. 08, 2019
Products
Ion Beam Preparation of Samples for SEM
Download this 76-pages booklet today and learn how to improve your processes In this booklet you can find information about how ion beam milling can help you to:
Nov. 08, 2018
News
Correlative Microscopy Using SEM Array Tomography
Burel et al., recently presented an optimized scanning electron microscopy (SEM) workflow for volumetric Array Tomography for asymmetric samples. A modified diamond knife was modified to simplify serial section arrays acquisition with ...
Nov. 08, 2018
News
Creating Serial Ultrathin Sections for SEM Array Tomography
In a paper by Taro Koike et al., a new “Device for Ribbon Collection for Array Tomography with Scanning Electron Microscopy” is presented. Serial ultrathin sections in the ribbon state (ribbons) are mounted on a solid substrate ...
Jul. 31, 2018
Products
Hitachi High-Technologies launches the SU7000
Hitachi High-Technologies Corporation announced that it will launch the SU7000, a Schottky field emission scanning electron microscope (FE-SEM) that incorporates a large specimen chamber, enhanced versatility, and high throughput with ...
May. 24, 2018
Applications
The effect of magnesium on the corrosion of hot‐dip galvanized steel in chloride containing ...
In this article published in Materials and Corrosion 65. No. 9, T. A. Keppert et al. report on the testing of three different hot-dip galvanizing alloys in salt spray tests. A Leica EM TIC 3X was used to polish cuts of metallographic ...
Apr. 17, 2018
News
Webinar: Correlative Raman Imaging and SEM
Correlative microscopy is a hybrid approach that looks at a sample with different microscope technologies, each optimized individually then later linked for a far more detailed analysis of chemical and structural features. A new ...
Mar. 15, 2018
Products
Leica EM TIC3X – Ion Beam Slope Cutter
The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
Mar. 15, 2018
Products
Leica EM TXP – Target Surfacing System
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely ...
Nov. 24, 2017
Products
TopoMAPS Software for SEM Image Analysis from Thermo Fisher Scientific
The TopoMAPS software for SEM image enhancement, 3D reconstruction and metrology from Digital Surf is now available on Thermo Scientific SEM and DualBeam systems. Highlights:
Oct. 24, 2017
Science
Reconstruction of Вazhenov Shales
Focused Ion Beam / Scanning Electron Microscopy tomography is an unique method for the 3D description of different materials on the micro- and nanoscale. The application of this method to the microstructural study of gas and oil shales is ...

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