SEM | Imaging & Microscopy - Research, Development, Production

Oct. 30, 2019
Products
WITec's RISE Microscopy Now Available with Zeiss Sigma 300 SEM
WITec’s solution for correlative Raman-SEM imaging is now available for Zeiss Sigma 300, a field emission scanning electron microscope (FE-SEM). With this jointly-developed system, WITec and Zeiss have furthered their collaboration ...
Sep. 25, 2019
Science
$Diffraction Based Strain Mapping in Electron Microscopy$
Diffraction Based Strain Mapping in Electron Microscopy
Strain is a critical parameter for numerous novel material systems and can also yield information about local chemistry or defects. Several electron microscopy (EM) based techniques exist to measure this important quantity on the ...
Jul. 12, 2019
Science
Secondary Electron Energy Matters
Secondary Electron (SE) Imaging in Scanning Electron Microscopes is fundamental to Materials Science including polymers - yet it lacks nanoscale chemical information, unless samples are stained. Change comes when sets of images using SEs ...
Jun. 18, 2019
Science
ITO Substrates for CLEM of Fibril Proteins
Correlative light and electron microscopy in a SEM is usually performed using glass commercial substrates coated with indium-thin oxide. These substrates however show a patchy background unavoidably imaged when fibril proteins are ...
Apr. 08, 2019
Science
Measuring the Bacterial Adhesion
To determine the antimicrobial efficacy, the research in the field of bioadhesion is crucial. Experiments include cultivations with E. coli K12 JM109 to reach bacteria adhesion in order to enable adhesion force measurements between ...
Feb. 18, 2019
Science
Conducting Controlled In Situ High Temperature Tensile Tests
A methodology to perform in situ high temperature tensile tests of Mg-alloys within a SEM with a high degree of mechanical and temperature control is described in detail. The fact that Mg might vaporize under vacuum requires technical ...
Jan. 08, 2019
Products
Ion Beam Preparation of Samples for SEM
Download this 76-pages booklet today and learn how to improve your processes In this booklet you can find information about how ion beam milling can help you to:
Nov. 08, 2018
News
Correlative Microscopy Using SEM Array Tomography
Burel et al., recently presented an optimized scanning electron microscopy (SEM) workflow for volumetric Array Tomography for asymmetric samples. A modified diamond knife was modified to simplify serial section arrays acquisition with ...
Nov. 08, 2018
News
Creating Serial Ultrathin Sections for SEM Array Tomography
In a paper by Taro Koike et al., a new “Device for Ribbon Collection for Array Tomography with Scanning Electron Microscopy” is presented. Serial ultrathin sections in the ribbon state (ribbons) are mounted on a solid substrate ...
Jul. 31, 2018
Products
Hitachi High-Technologies launches the SU7000
Hitachi High-Technologies Corporation announced that it will launch the SU7000, a Schottky field emission scanning electron microscope (FE-SEM) that incorporates a large specimen chamber, enhanced versatility, and high throughput with ...

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