SEM | Imaging & Microscopy - Research, Development, Production

May. 24, 2018
Applications
The effect of magnesium on the corrosion of hot‐dip galvanized steel in chloride containing ...
In this article published in Materials and Corrosion 65. No. 9, T. A. Keppert et al. report on the testing of three different hot-dip galvanizing alloys in salt spray tests. A Leica EM TIC 3X was used to polish cuts of metallographic ...
Apr. 17, 2018
News
Webinar: Correlative Raman Imaging and SEM
Correlative microscopy is a hybrid approach that looks at a sample with different microscope technologies, each optimized individually then later linked for a far more detailed analysis of chemical and structural features. A new ...
Mar. 15, 2018
Products
Leica EM TIC3X – Ion Beam Slope Cutter
The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
Mar. 15, 2018
Products
Leica EM TXP – Target Surfacing System
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely ...
Nov. 24, 2017
Products
TopoMAPS Software for SEM Image Analysis from Thermo Fisher Scientific
The TopoMAPS software for SEM image enhancement, 3D reconstruction and metrology from Digital Surf is now available on Thermo Scientific SEM and DualBeam systems. Highlights:
Oct. 24, 2017
Science
Reconstruction of Вazhenov Shales
Focused Ion Beam / Scanning Electron Microscopy tomography is an unique method for the 3D description of different materials on the micro- and nanoscale. The application of this method to the microstructural study of gas and oil shales is ...
Sep. 20, 2017
Science
Friction Layer of Automotive Brake Pads
Wear of friction materials symbolizes a challenge since several chemical compounds are being released. There is still a lack of information about chemical composition of friction layer and the wear debris. It is necessary to develop ...
Aug. 07, 2017
Products
WITec’s RISE Correlative Microscopy is Now Available with ZEISS SEM Systems
The WITec RISE microscopy mode for correlative Raman-SEM imaging is now compatible with Zeiss Sigma 300, a field emission scanning electron microscope (FE-SEM). With this jointly-developed hybrid system, WITec and Zeiss have furthered ...
Jan. 25, 2017
Products
EBSD Detectors and Visualization Software
Bruker has introduced the e-Flash FS and e-Flash HD in a new generation of detectors for electron backscatter diffraction (EBSD) analysis on scanning electron microscopes (SEM).
Sep. 15, 2016
Science
Synergy of SEM and Ultramicrotomy
Serial block-face scanning electron microscopy (SBFSEM, SBEM) is a well established method in life sciences. The combination of ultramicrotomy and scanning electron microscopy enables imaging with high resolution and the reconstruction of ...

12 3 4 5 6 7 8…

Register now!

The latest information directly via newsletter.

GIT Verlag