Sep. 29, 2011

Multimodal Optical Nanoprobe for Transmission Electron Microscopes

The U.S. Department of Energy's Brookhaven National Laboratory and Nanofactory Instruments, a Swedish company that develops and markets scanning probe microscopy instrumentation, have received the 2011 Microscopy Today Innovation Award. Microscopy Today is an academic journal owned by the Microscopy Society of America, an affiliate of the American Institute of Physics and the American Association for the Advancement of Science, and published by Cambridge University Press.

At the Microscopy Society of America's annual meeting in Nashville, Tennessee, August 7-11, 2011, Brookhaven Lab senior physicist Yimei Zhu accepted the award on behalf of Brookhaven Lab and Nanofactory Instruments. The award consists of a plaque that commends the institutions "for the development of the Multimodal Optical Nanoprobe which enables a synergistic combination of physical measurements in a Transmission Electron Microscope."
Zhu, a Brookhaven Lab senior physicist, led the Brookhaven team that worked with Nanofactory Instruments, to develop the multimodal optical nanoprobe. The device is mounted on a transmission electron microscope to measure numerous properties of a sample simultaneously, in addition to imaging.

The nanoprobe measures the optical, electrical, mechanical, and structural properties of nano-sized materials and devices that are magnified from 1,000 to 50 million times. Combining various measurement techniques in one instrument offers a new level of material characterization that is not possible by sequential application of the techniques. These capabilities have been streamlined into a single package that, with minimal expense and difficulty, can be integrated into almost any electron microscopy system.

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